Next Generation SDD for Enhanced Performance from Carbon (C) to Americium (Am)
The HighSense™ XP sets new benchmarks in energy-dispersive X-ray fluorescence (EDXRF) detector technology. It is the latest addition to Bruker’s HighSense Silicon Drift Detector (SDD) series.
The highlights include:
- Ultra-high sensitivity from C-Am
- Dynamic Detector Profiling
- Bruker’s own chip technology
- Robust 0.9 µm Graphene window
- No toxic components (Be-free!)
- and more…
In conjunction with the powerful 50 W X-ray tube the S2 PUMA Series offers unrivaled performance in the world of EDXRF spectrometers.
During this 45-min live event, you will have the opportunity to learn more about the S2 PUMA Series 2 with the new HighSense XP detector can do for you!
Our presenter, Dr. Adrian Fiege, will show the benefits of the HighSense XP based on application examples and answer your questions.
Thursday, June, 10, 2021
1 pm (CEST/MEZ)
Speaker
Dr. Adrian Fiege
