X-Ray Reflectometry and Grazing Incidence Diffraction
This training course will show the different methods used for X-ray reflectometry (XRR) and grazing incidence diffraction (GID) measurement and analysis, including the DIFFRAC.EVA and DIFFRAC.XRR software packages. The course is intended for users with experience in XRD.
This class will be scheduled on request.
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Further Information
Location
Language
English
Class size
Because our trainings are interactive and learner-oriented, we limit class size to a maximum of six participants. Early enrollment is encouraged as registrations are accepted on a first-come/first-serve basis. We reserve the right to cancel a course and will notify participants four weeks prior to the start date if the course is cancelled.
Attendance fee
The course fee is $1,870 USD per attendee per two-day session.
Contact
For further information about the course content, please contact:
Ben Krueger
Applications Scientist, XRD
For information about price, registration, or other questions:
Melanie Swanson
Marketing Specialist
For a quotation, please contact: