Electrostatic force microscopy (QI™-EFM) on NIPAM particles on silicon. 3D ForceCube™ images collected with NanoWizard NanoScience, calculated at different distances between tip and sample. Scan size: 4.5 μm × 4.5 μm.
Sample courtesy of:
Prof. R. von Klitzing
TU-Berlin, Germany.
Electrostatic Force Microscopy (EFM, one-pass) on SRAM (Core I5 processor, Intel). Imaged with NanoWizard NanoScience.
Conductive atomic force microscopy (QI™-CAFM) on battery electrode. Scan size: 4.5 μm × 4.5 μm. Images collected with NanoWizard NanoScience.
Sample courtesy of:
Prof. Dr.-Ing. A. Kwade
TU Braunschweig, Germany.
Conductive atomic force microscopy (CAFM-QI™) on CU conduct layer (Core I5 processor, Intel). Scan size: 1.4 μm × 1.4 μm. Images collected with NanoWizard NanoScience.
Conductivity landscape and height image of a graphite-clay blend. Images collected with NanoWizard Sense.
Kelvin Probe Microscopy (QI™-KPM) on an interdigitated electrode. Data collected with NanoWizard NanoScience.
3D height image is overlaid with surface potential information. The raised electrodes (100 nm thick) are interdigitated in pairs, the separation between topography and potential is clear. Scan size: 15 μm × 15 μm, color texture range: 750 mV.
Kelvin Probe Microscopy (KPM) on an interdigitated electrode. Data collected with NanoWizard NanoScience.
The height image is displayed as 3D topography with the added color to indicate measured surface potential. The raised electrodes (100nm thick) are interdigitated in pairs, the separation between topography and potential is clearly visible. Scan size: 21 µm x 21 µm.
Kevin Probe Microscopy (KPM, one-pass FM) on SRAM (Core I5 processor, Intel). Scan size: 4.5 μm × 4.5 μm. Imaged with NanoWizard NanoScience.
NanoWizard NanoScience overlay of magnetic force information and 3d height image on NiFe square structure. Magnetic domains and Landau pattern are clearly visible. Scan size 8 μm × 8 μm.
Sample courtesy of:
Dr. Katrin Schultheiss, Institute of Ion beam Physics and Materials Research
Helmholtz-Zentrum Dresden-Rossendorf, Germany
NanoWizard NanoScience topography and phase (MFM with magnetic cantilever) images of rectangular magnetic structures on NiFe. Magnetic domains and Landau pattern are clearly visible. Scan region 20 µm x 20 µm; z-length: 60 nm.
Sample courtesy of:
Philipp Pirro
TU Kaiserslautern
Magnetic Force Microscopy image (MFM) of a hard drive section. The bit structure of the hard disk (magnetic domains) can be observed. Scan size 3 µm x 3 µm. Imaged on the NanoWizard NanoScience AFM.
Piezo-response phase, height, and amplitude images of lithium niobate crystal. Scan field: 21 µm x 24 µm. Images collected with NanoWizard NanoScience.
Piezoresponse Force Microscopy (PFM) of a ferroelectric copolymer (P(VDF-TrFE)). A sequence of voltage pulses (+/-20 V range) was generated from a bitmap to write the pattern into the piezoelectric polarization of the sample. Imaged with NanoWizard Sense.
Scanning Tunneling Microscopy image (STM, current) of arachidic acid molecules on HOPG collected with NanoWizard NanoScience. Scan size: 25 nm × 25 nm; current range: 0.8 nA; bias: 0.3 V.
Scanning thermal microscopy measurement with VertiSense™ module on AppNano thermal test sample. Images collected with NanoWizard NanoScience in QI™ mode with VertiSense™ Probes. Scan size: 20 μm × 20 μm