Thin Film Thickness and More with DIFFRAC.XRR
Thin films are often applied to surfaces to modify their properties. They are also used to create next generation sensors and microelectronic devices. As the thickness of films approach nanometer scales, it is important to have a tool for quantifying their thickness. X-ray Reflectometry (XRR) is a method used to quantify the thickness, density and roughness of thin films. In this episode of Live from the Lab we will discuss XRR and see how to analyze measurements in DIFFRAC.XRR.
Broadcast live from Bruker's YouTube channel once each month, our Live from the Lab streaming series explores X-ray Diffraction, X-ray Microscopy, and Elemental Analysis topics, with advice from applications experts who also answer questions that come in during the show. Be sure to subscribe to our YouTube channel so you never miss an episode!