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On-Demand Session: 2D Material Characterization Using Photothermal AFM-IR and s-SNOM

Learn about two complementary nanoscale IR spectroscopy and imaging techniques, photothermal AFM-IR and s-SNOM.

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Presented by Anirban Roy, Ph.D., Senior Applications Scientist, Bruker, and Cassandra Philips, Ph.D., Application Scientist, Bruker

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Graphic representation of AFM-IR and s-SNOM tip-surface interfaces

Comparison of AFM-IR and s-SNOM

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