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How to Extend Your Wyko and Bruker Optical Profiler Capabilities

Learn how to collect comprehensive 3D surface visualization and analytical data by combining WLI optical profiler technology with Vision64 map software
Presented by Samuel Lesko, Ph.D. Dir. of Technology and Apps Development, Bruker Nano Surfaces & Metrology (March 20, 2018)

       PRESENTATION HIGHLIGHTS:

  • [00:01:38] Bruker WLI optical profilers and other solutions for 3D surface measurement
  • [00:05:35] Vision64 map software
  • [00:13:09] Key advancements in WLI optical profilometry technology and capabilities
    • [00:13:28] Advanced VSI mode
    • [00:21:50] Lateral resolution
    • [00:28:19] Slope measurement capabilities
    • [00:33:44] Correlate topography with optical view
    • [00:41:57] Measuring thin films
    • [00:49:55] Stitching >1000 images
  • [00:59:40] Live audience Q&A with the speaker

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